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CSD95490Q5MC: CSD95490Q5MC MOS damage damage occurred after one year of work

Part Number: CSD95490Q5MC
Other Parts Discussed in Thread: TPS53681


     We have a project using TPS53681+6*CSD95490;12V input,0.86V/ peak 300A output .

The equipment has been running for one year, but the CSD95490 was damaged(Cracking and VIN to PGND short), as shown in the figure below:

1、Please help to analyze the reason?

2、Please provide the calculation method of MTBF?

3、Three devices have had the same problem


We did the following test:

1、test condition:continuous output current=270A,TA=40℃,TJ=98℃.

2、Vsw to PGND test waveform(The Vsw overshoot is relatively high. We doubt whether the Vsw overshoot affects the life)?