Other Parts Discussed in Thread: TPS65150-Q1
Hi Sir,
The customer asked that TPS65131-Q1 and TPS65150-Q1 both devices if have passed the below AEC-Q100 Qualified test items? or only have passed some test items?
Both devices' D/S showed the "AEC-Q100 Qualified" is determined based on TI's internal test results? Or is it verified by an external company?
|
Standard |
Details |
|
AEC-Q100 |
Failure Mechanism Based Stress Test Qualification For Integrated Circuits (base document) |
|
AEC-Q100-001 |
Wire Bond Shear Test |
|
AEC-Q100-002 |
Human Body Model (HBM) Electrostatic Discharge Test |
|
AEC-Q100-003 |
Machine model (MM) Electrostatic Discharge Test |
|
AEC-Q100-004 |
IC Latch-Up Test |
|
AEC-Q100-005 |
Non-Volatile Memory Program/Erase Endurance, Data Retention, and operational Life Test |
|
AEC-Q100-006 |
Test of parasitic gate leakage current caused by thermoelectric effect. |
|
AEC-Q100-007 |
Fault Simulation and Test Grading |
|
AEC-Q100-008 |
Life cycle failure rate（ELFR） |
|
AEC-Q100-009 |
Electrical Distribution Assessment |
|
AEC-Q100-010 |
Solder Ball Shear Test |
|
AEC-Q100-011 |
Charged Device Model (CDM) Electrostatic Discharge Test |
|
AEC-Q100-012 |
Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems |
