Hi,
The basic calculations in Table A7.1 of AEC-Q100 (reproduced in figure) for each of the major stress components, demonstrate how one can derive the reliability margin between the component (specification) space and the application (condition) space. 
The Texas -EP products have a minimum Qualification Requirement of -65C to +150C 1000 cycles. That is just 10°C more than AEC-Q100 and same number of cycles...
Therefore, say for example if in a particular application, due to on/off the device is subjected to ΔT_usage=75°C, then:
N_usageEP product =N_test*A_f→ N_usage=1000* ((215°C)/(75°C))^ m = 67.531 cycles
N_usage AECQ product =N_test*A_f→ N_usage=1000* ((205°C)/(75°C))^ m = 55.817 cycles
So the -EP product has just slightly better number of cycles if we take parameter m= 4 in both cases ?.
The question is, where can we get the Coffin Manson parameter 'm' value to calculate this for EP products? The Enhanced Product line claims to modify bondwires and a number of package characteristics to enhanced reliability. So it is reasonable to assume that this parameter is dissimilar (improved) compated to AEC-Q100 device cousins.
Is there a calculattor to check this for each -EP part?
