Hello,
We are designing with the LM5164 and had a question about Table 3-1 in the datasheet.
Could you please let us know how you determine the "Failure Mode Distribution (%)" for the various Die Failure Modes.
- Is there more documentation on how to interpret this data?
- Does this mean these failures were detected on some wafer tests?
- Were these these numbers measured?
Thanks so much, Keith