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UCD3138ALLCEVM150: Testing for anomalies in 250ps resolution

Part Number: UCD3138ALLCEVM150
Other Parts Discussed in Thread: UCD3138A

When I conducted DPWM high-resolution testing on the control board UCD3138ALLCEVM149, I found the following abnormal situations



The test conditions are:



UCD149ALLCEVM3138 Control Board for UCD3138A LLC Evaluation Module



Using TI's LLC half bridge example program, enable unused DPWM 2 modules for testing on this basis

 

Set the loop value to 100




Events 1, 2, 3, and 4 are set to 0, 2, 40, 50

 

Change the value of Event 4 to 95 through Debug in the UCD3xxx Device GUI




The testing phenomenon is:

Discovered discrepancies between the high level time values of the unchanged and changed waveforms and the set values

 

The rising and falling edges of the waveform before the change are: 40, 50, and the value of the high-level time is 5.3ns, set to 2.5ns, with a difference of 2.8ns

 

The rising and falling edges of the changed waveform are: 40, 95, and the value of the high-level time is 15.9ns, set to 13.75ns, with a difference of 2.24ns

 

The difference between the two waveforms after comparison is 10.55ns, set to 11.25ns, with a difference of 0.7ns

And when I tested the DPWM wave, I found that the output waveform was not stable, with a jitter of 500ps under infinite afterglow

Regards,