Other Parts Discussed in Thread: TPS25985
Hi, TI support team
1. In order to implement the “Programmable fast overcurrent detect” function described in the datasheet, GPIO3 used as SWEN was changed to Comp1 out, which is the output of Internal Comparator 1. for teeth
I checked by changing the efuse register E4h[2] (Device Config), E2h[7:5], Ebb(comp1 ref)[3:0], and found that once the GPIO3 output goes low, it does not go up again, and the Status Register It was confirmed that the
CMP1_FLT indicator occurs at 80h[0].
Regarding the above, if GPIO3 is not used as SWEN but as Comp1 output, how should the register be set?
(Do I need to save the above settings to NVM and then check it?)
2. An EEPROM is connected to the EVK we are using, but looking at the internal status register value, it appears that both NVMs are used and the EEPROM is not recognized by efuse.
The registered values confirmed for this purpose are E3h[0] = 1 F3h[0] = 1, F3h[7] = 0.
Have you properly checked whether the internal NVM can be used?
Is there anything else I need to check?
If it is true that NVM cannot be used, please tell us what to set up to use an external EEPROM.
3. Two methods for generating high voltage applied to SWEN of efuse are proposed in the datasheet as shown below.
Is there a reason why the Zener diode voltage was selected as 4.7V?
Is there anything else I need to pay attention to when using Zener diode?
Thanks.
Regards,
MJ