I have to evaluate the dissipation capacity of this device considering that it will be encapsulated in a resin "brick" which allows for an θCA thermal resistance of approximately 2 °C/W.
How can I use the "Junction-to-top-characterization parameter" ΨJT to thermally characterize the assembly? Is there a way to correlate ΨJT with the junction-case thermal resistance?
Thanks in advance