Hello,
We have entercountered come issue on an finctional tester with our assembly that goes thru finctional tester. This problem occured once we started using components after PCN20221216002 implementation.
The main concer now is that devices fail step where we check pulse width short circuit current +15V. Previousley we had results around 14015ms, now the tester show 25ms. . Does anyone know whether those two parameters have been changed after PCN20221216002 ?
The only thing I found in the PCN is an information that electrical parameters have been modified, but to be honest I would need to know which exactly.
Thanks in advance!
Szymon
