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LM3880: Factory set EEPROM sensitivity to Neutron Single Event Effects

Part Number: LM3880

Have TI products utilizing factory set EEPROM (ie LM3880, TPS72733DSET, etc...)  experienced memory corruption due to atmospheric neutron single event effects?   Is there a paper showing immunity or upset rates?

Thanks

Ben Krawczyk

  • Hi

    LM3880 is a pure analog device without SRAM and EEPROM naturally is not sensitive to the SEU.

    TI does not perform any SEU test on LM3880 and no customer has reported any issue.

    Regards

    Yihe