Have TI products utilizing factory set EEPROM (ie LM3880, TPS72733DSET, etc...) experienced memory corruption due to atmospheric neutron single event effects? Is there a paper showing immunity or upset rates?
Thanks
Ben Krawczyk
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Have TI products utilizing factory set EEPROM (ie LM3880, TPS72733DSET, etc...) experienced memory corruption due to atmospheric neutron single event effects? Is there a paper showing immunity or upset rates?
Thanks
Ben Krawczyk