Other Parts Discussed in Thread: ULN2003B,
Tool/software:
Hola ,
We had design a product around this IC , the IC functional test found okay, during trial production batch , the IC was found okay. Now my product just entered into production phase & we are facing issue. The said IC gets damage. in production batch of 10 batch 7 pass & 3 fails, the testing & production remains untouched. I am sharing batch code for one failed IC , can you please suggest is it a batch level IC issue.
marking over IC : UN2003B 26KG4 AX16 .
the thermal cycle is in range of -30 degree C to 55 Degree C . for time duration 7hr
It would be great if you could suggest me some way out , my yield of product is affecting.
Please note all the ULN2003B IC were sourced via digikey.
Warm Regards
Gaurav