Tool/software:
Hi team
from below post.
BU side have commented that if the VON earlier than VIN. the load switch performance may be changed.
could I know more detail? why the performance would change and how it change?
BRs
Brian
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Tool/software:
Hi team
from below post.
BU side have commented that if the VON earlier than VIN. the load switch performance may be changed.
could I know more detail? why the performance would change and how it change?
BRs
Brian
Hi Brian,
Power sequencing outside of the VIN -> VON could have three effects on the TPS22964C load switch:
1. Long term reliability is affected. This means that the device may see early failures over high stress lifetime testing.
2. Slew rate circuitry may not behave as expected as it will be limited by the ramp of VIN
3. Quiescent current may be higher than expected depending on the device (process variation).
The rest of the specifications will act normally. If the TPS22964C is used for any functional testing for the device (not fault conditions or lifetime testing) then any power sequence would work for the device, keeping in mind that quiescent current may be higher than expected.
Best Regards,
Elizabeth