Tool/software:
Hi,
I am currently using the LM5085MY/NOPB component in our system.
Input voltage range: 24V to 54V
Output: 24V, 2A
During validation testing, I discovered that the IC's internal negative bias regulator has been damaged.
What could be the reasons for the damage to this internal block?
Hi Ericlee,
Voltage across the VIN & VCC should need to be 7.7V but while at failure case we found that 0V and Impedance across is below 10 ohm.
Hello Aakash
There is a 10V ESD cell between the VIN pin and the VCC pin. This ESD cell can be damaged if the VCC pin is accidently connected to ground, usually due to a mishandling.
Also, there is a 76V ESD cell between VIN and GND. There is a possibility that the negative bias regulator is damaged when the VIN pin is damaged by a surge voltage during initial power on.
-EL
Hello Aakash
It is not allowed to disclose the internal structure of the device, but you can find what you want in the Absolute Maximum Rating table.
In general, the Absolute Maximum rating is defined by the ESD cell rating. Please find the 10V Abs Max between VIN and VCC, and find 76V Abs Max between VIN and GND in the Absolute Maximum rating table below.
I don't think the load can damage the VIN pin because the load is not directly connected to the VIN pin.
-EL
