Other Parts Discussed in Thread: TPS7B4255
Tool/software:
Hi team,
My customer says they will do EE test to TPS7B4255-Q1 and wonders if TPS7B4255-Q1 can meet this test. (Customer says competitor's device cannot meet this test.) The following is the test method.
1) Disconnect DC supply's GND with PCB's GND.
2) Connect DC supply's GND with TPS7B4255-Q1's out pin and last for 60s.
There're 2 points customer is concerned about:
1) When DC supply's GND is disconnected (hot-swap), there will be a negative overshoot voltage at IN pin of 4255, which will be coupled to the OUT pin through input capacitor and output capacitor. And there will be a microsecond negative voltage at OUT pin (about -10V to GND). Will this negative voltage damage the device?
2) The positive and negative poles of the DC supply are connected to the IN and OUT pins of the 4255 and last for 60 seconds. Will this damage the device?
Thanks and looking forward to your reply.
BR,
Grey