This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

CSD19538Q3A: Measures to prevent breakage

Part Number: CSD19538Q3A
Other Parts Discussed in Thread: TPS23521

Tool/software:

Hi All

When the output was shorted, the CSD19538Q3A (FET1) and the TPS23521 were damaged.

Is there any way to deal with this?

Below is a simplified circuit diagram.

The cause of the damage is that the FETs were configured in a two-stage configuration, so FET2 begins to limit the current.

The resistance between the S and D of FET2 increases, causing the voltage at the drain of FET2 to increase.

The drain of FET2 is the source of FET1 (CSD19538Q3A), so as the source voltage increases, the voltage between the G and S of FET1 (CSD19538Q3A) decreases, causing the gate voltage to decrease.

This causes the resistance between the S and D of FET1 (CSD19538Q3A) to increase, and the load is concentrated on FET1 (CSD19538Q3A), causing it to be damaged.


Please let me know if there are any good ways to prevent damage.

Best Regards,
Ishiwata