Tool/software:
Hi TI Team,
At present, I am testing the chip BQ25756E, and I need to consult you for some problems, which are as follows:
1. After configuring the register, power it on and off again. Can the register value be saved?
2, TS pin, battery temperature measurement NTC B value know whether there are requirements (3435/3950);
3, the chip is powered on, do not configure the register, the default setting of the dead time is what;
4, 29.4V input, 2.5A current charging, switching frequency set 600KHz, MOS tube temperature 98℃, measured the step-down test tube, found that there is a phenomenon of simultaneous on-off, please tell me how to optimize;
5, 6 series batteries, after the voltage is charged to 25V, there will be a similar hiccup phenomenon, the SW switch waveform is fluctuating, and the output current will change greatly at this time (current fluctuation exceeds 0.5A), please tell me whether this phenomenon is normal, and if it is abnormal, how to optimize it;
6. When IIC communication is not used, the input undervoltage protection is set separately by hardware. There is a 2V deviation between the calculated undervoltage protection value and the measured value (RAC1=1000K, RAC2=6.2K, RAC3=38.3K, range 25.82-33.48V), and the protection is turned off when the measured value is below 28.3V; and
7, in the process of testing the charging curve, the constant voltage charging process, there will be a current rise process, the current curve is not smooth, what is the reason?
8、Test the charging current curve, found that the constant voltage phase charge to 0.18A directly ended the charge, this is normal?