Tool/software:
Hi,
1. Please tell me the reason why there is a package whose value of RθJA is larger than RθJC and why there is a package whose value of RθJC is larger than RθJA in TLV757P.
2. Also, could you confirm whether my understanding of RθJA and RθJC is correct?
If the difference between the junction, which is the source of heat, and the package surface temperature is large, the thermal resistance value increases. (Thermal difference ÷ loss: The thermal difference increases as the loss increases.)
■RθJC measurement conditions
The package surface is at a low temperature because most of the heat is taken away by the cold plate, and the plastic material of the package has a low thermal conductivity, which makes it difficult for heat to pass through. Therefore, the thermal difference inevitably increases. In order to limit the outflow of heat from the bottom of the device at this time, it is mounted on a single-layer substrate (Low-K condition). When this definition was used in the past in JEDEC, it was under the condition that a heat sink was installed.
■Rθja measurement conditions
It is mounted on a four-layer substrate (High-K condition), and the outflow of heat from the bottom of the package to the direction of the thermal pad is dominant. (The reason is that the thermal conductivity of the "non-flowing" air from the package surface to the space is so low that almost no heat can be released. What can be released is radiation energy, but it is within an error range. Rθja measurement is performed under conditions where there is no flow of outside air. )
As described above, since the definition has a large difference in measurement conditions, Rθjc is rarely used (if there is a case where a heat sink is installed by insulating the bottom of the device, it is applied).
Best Regards,
Nishie