Tool/software:
IC started normally, after few hours in use, IC heating up, up to the moment of destroy. (meanwhile the second field fail used on medical device)
ABA test gives the clear few, that the IS is damaged, restart the Board with a new IC no malefunction occures.
IC SMD BATTCHARGER BQ25616J QFN24 / MPN: BQ25616JRTWR/T
From our point of view, it is necessary, that TI will analyse this IC, to get a clear overview which area of this IC is effected.
X-ray analyses with no detected fails