Tool/software:
The Efuse test surge of -1KV used in our project can cause the load side circuit to break down and catch fire;
What is the response time of TPS2660 internal cut-off MOSFET?
The application is as shown in the above figure
Test conditions: Input terminal powered by 24V, loading -1kV differential mode surge test will burn out the subsequent circuit
What could be the possible cause of this damage?
Please help to determine if it is a design issue or if this chip is not suitable for this application, and provide a solution. Thank you!
