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TPIC6C596: EOS/EIPD in SER OUT

Irving Caballero
Prodigy 20 points
Part Number: TPIC6C596


Tool/software:

I have worked with TI FQE and submitted two QEM jobs: QEM-CCR-2410-00018 and QEM-CCR-2410-00019.  Both jobs are showing eos/eipd which we don’t understand how this happens if the SER OUT is clocked out of the device.  Can someone from the product line please contact me and I can share the schematic

  • 0
    TI__Genius 11865 points

    Hi Irving,

    You can post the schematic here, or send it to me via private message if you do not want it posted on the public forum.

    I am working on pulling your quality reports... EOS usually occurs due to an overvoltage condition that violates the absolute maximum ratings of the device. Can you provide any additional information on the fault condition?

    Did the fault occur during final test or was this a return from the field?

    What was the test/operating condition during the failure? For example, does the failure occur on power cycle? Is there some stress test applied to the system during failure?

    Regards,

    Zach

  • 0 in reply to Zach Olson
    Prodigy 20 points

    Hi Zach,

    I sent you the schematic in a private msg 

  • 0 in reply to Irving Caballero
    TI__Genius 11865 points

    Hi Irving,

    I will go ahead and close this thread for now. We will continue the conversation via private message.

    Thanks,

    Zach