UCC27537: Getting damaged frequently

Hey,

Thank you for reaching out to TI with your question regarding the UCC27537.

Looking at your schematic, I have a few recommendations and questions:

1. There should be a bypass capacitor on VDD - GND. This should be an X7R ceramic capacitor of 1uF. Also, it is a good idea to include a 100nF X7R ceramic capacitor in parallel for transient response. These should be placed as close to the driver as possible. This is outlined in Sections 11 Power Supply Recommendations and 12 Layout of the datasheet.

2. The 420 Ohm gate resistor is likely slowing the rise/fall of the MOSFET greatly. Something less than 100 Ohms is more typical and this can be changed to help control rise and fall times of the FET turn on and off.

3. We recommend an RC filter on the IN pin that is 0-100 Ohms and 10-100pF for noise filtering of the PWM signal.

4. Please also take waveform captures showing the VDD, OUT, EN and IN pins. This should be zoomed in to show one pulse of OUT in the window.

Let me know if there are further questions.

Thank you,

William Moore

Thanks, William, for quick response.

I have implemented your suggestion no failure observed.

Let me keep observing for few more days and I will update you.