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HD3SS3220: single event effect analysis

Part Number: HD3SS3220
Other Parts Discussed in Thread: CSD17313Q2, TMUX582F-SEP

Tool/software:

Dear,

we are using some of the parts in our design:

HD3SS3220IRNHT

NA555DR

TPS25910RSAR

TPS22811LRPWR

SN74LVC1G17QDCKRQ1
SN74LV1T32DCKR
OPA4991IPWR
LM2903AVQDRQ1

ISO7340CQDWQ1
LM4050QCEM3-5.0/NOPB

CSD17313Q2

can you please suggest me how to perform SEE analysis?

in which technology feature and node (nm) these chips have been manufactured?