Tool/software:
Which method was used to determine the mean time before failure (MTBF) of LMZ14201HTZX/NOPB?
For example, were Telcordia SR-332 or MIL-HDBK-217 used?
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Tool/software:
Which method was used to determine the mean time before failure (MTBF) of LMZ14201HTZX/NOPB?
For example, were Telcordia SR-332 or MIL-HDBK-217 used?
Hi Kyle,
I will check internally and get back to you.
Regards
Arpita
Hi Kyle,
Sorry for delayed response. I have confirmed internally, it is SR-332.
Regards
Arpita
Arpita,
Thank you for your response.
Could you provide any further clarification on which method of Telcrodia SR-332 was used (Method I, II, or III)?
I am assuming that SR-332, Issue 3, Method II was used, as on the reliability data spreadsheet available online there seems to be testing data to support the MTBF calculation.
It seems to me as if the data is from a laboratory test and not from real application of the product, which would exclude Method III. Further, the existence of any testing data at all would seem to exclude the possibility that only Method I was used, which leads me to assume it was Method II.
Please let me know if you can confirm these assumptions or clarify anything. Thank you again for your help.
Hi Kyle,
May I know for what purpose you need such details?
I will try to check internally and get those detailed information.
Regards
Arpita
Arpita,
We are calculating MTBF for one of our products. For simple components such as resistors and capacitors we can reference standard documents and do the calculations ourselves. However, for more complex off-the-shelf parts, we do not have knowledge of the precise electronic components that make up that part, and so we must rely on internal calculations from the manufacturers. We have found that different vendors/manufacturers use different reliability calculation methods, and since we cannot control which method they use, we are instead noting the methods used by manufacturers just for our internal records. That way, we can go back and say "The MTBF for [component] is [XX] provided to us by [manufacturer] using [reliability method]".
If it is known if Telcordia SR-332 Method I, II, or III was used, that's great. But if that info is not readily available or shareable, I understand. Thank you for your help.
-Kyle
Hey Kyle,
I will try to get those details and if I get those, I will get back to you.
Thank You
We use the method described in JEDEC publication JEP122H, paragraph 5.19.1.4. The basis for the calculations is HTOL data aggregated across the silicon technology. An Exponential Distribution (constant hazard rate) is assumed. HTOL stress time is then de-rated to a reference application use condition by an acceleration factor. Typically, Ea=0.7eV is assumed for temperature de-rating. A FIT value is calculated from the data, and then the MTBF (which for the Exponential Distribution is the same as MTTF) is the result of the reciprocal of FIT/10^9.