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BQ76952: Fets getting damaged during short circuit test.

Part Number: BQ76952

Tool/software:

Hi Ti Team,

We are seeing an issue where we can successfully perform SCD (short circuit in discharge) on 400A, but it damages our DSG FETs and gate-source diode when we perform SCD at 800A and higher (we’ve tested up to 1500A).

I will PM schematics, gg file, and waveforms to the responder.

Specifics- When measuring VG to VSS and current during this issue, VG goes from BAT + 11V (around 36V) to VSS as expected and current cuts off, but after about 1-2ms, VG raises to about 18V and current begins flowing again. Once the current starts, this lasts about 60ms where the FETs blow.

Reading through previous posts, we are going to measure pins on the BQ (SRR, SRP, LD, BAT, REG18) and FET nodes (VG, VS).

If the BQ76952 is resetting during the event, can we tell by looking at the thermistor pin?  Any other better way to detect reset?