LMG3522R030-Q1: Single-Event Effects (SEE), Single-Event Latchup (SEL) and Single-Event Upset (SEU).

Christopher Adams

Part Number: LMG3522R030-Q1

Tool/software:

Has there been any; Single-Event Effects (SEE), Single-Event Latchup (SEL) and Single-Event Upset (SEU), testing / data generated for the following TI part numbers?

LMG3522R030-Q1
SN74LVC2G08DCU
ISO7741FDW

5 months ago

0 Madhur Wagle 5 months ago

TI__Intellectual 1170 points

Hi Christopher,

Let me check with the team and get back to you.

Best Regards,
Madhur

0 Madhur Wagle 5 months ago in reply to Madhur Wagle

TI__Intellectual 1170 points

Hi Christopher,

You can find each part's reliability tests here -

For LMG3522 these are the tests that have been performed -

Best Regards,
Madhur

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LMG3522R030-Q1: Single-Event Effects (SEE), Single-Event Latchup (SEL) and Single-Event Upset (SEU).