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UCC5880-Q1: Desat Function in a shoot-through event

Part Number: UCC5880-Q1

Tool/software:

Dear TI Team,

my questions are regarding the Desat function of the UCC5880-Q1 gate driver. I want to use 2 of it to drive 2x SIC MOSFETs  (Halfbridge) at max. 435V DC Link Voltage.

1- is it possible for DESAT function to detect and save the driver and the SIC MOSFET in a short-circuit current as a result of shoot-through event. i.e. the high side SIC is having a short (defect) and the low side is turning on?

2- the datasheet states that the response time to DESAT event is 110ns but I cannot find info about anyother Desat timings. Is there a blanking time? where can I find more info about that?

Thank you
Best Regards
Raeed