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UCC27524A: Reason for ESD change and electrical characteristics

Part Number: UCC27524A

Tool/software:

Hi team,

・Please tell me why the ESD HBM changed from 4000V to 2000V in Rev.C.

・Why are the electrical characteristics different between D and DGN? The die is the same for both packages, but is this due to the difference in test sites?

  • Hey Hirotsugu,

    Thank you for reaching out to TI with your questions regarding the UCC27524A.

    The datasheet revision is due to the PCN that was issued for the part.

    The PCN required the device to undergo quality testing again, and it was found that certain specs needed to be recharacterized. The ESD values were updated due to this recharacterization, but they are ensured to meet JEDEC guidelines.

    As a part of the PCN, there was a new test site. Please review the PCN document to see the OPNs that were included and what changes to test sites were made.

    Thank you,

    William Moore

  • Hi Wiiliam,

    Did the rating go down because the structure of the ESD changed in the PCN, or did the structure of the ESD remain the same but the rating went down as a result of re-evaluation?

  • Hey Hirotsugu,

    As defined by the PCN, there was a die change included in the PCN and therefore the ESD structure did change. The die and test site changes resulted in the re-evaluation as well.

    Thank you,

    William Moore

  • Hi William,

    I understand that the ESD rating has been lowered due to the die change, but it still meets the JEDEC guidelines.

    Thanks,