• State TI Thinks Resolved
  • Locked Locked
  • Replies 1 reply
  • Answers 1 answer
  • Subscribers 63 subscribers
  • Views 264 views
  • Users 0 members are here
Support feedback
Options
Options
Related

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

Original question:

UCC5870-Q1: DWJQ1

UCC5870-Q1: UCC5870-Q1-EMC-RS

han zheng
Prodigy 30 points
Part Number: UCC5870-Q1

Tool/software:

Hello, about the door drive chip UCC5870QDWJQ1 products, we have encountered the following abnormal problems in the application.

The problem is described as follows:
(1) Occurrence scenario: EMC test - RS radiation immunity test (the product is grounded with a protective conductive shell, and the field strength of DUT is set to 150V/m);
(2) Product application: used in ON/OFF scenarios, the driver needs to be kept in the ON state during the test process;
(3) Abnormal description: In the RS test of 400M-1G, the driver chip has a driving abnormality in the 500M-800M frequency band (in the case of a given ON, the drive output jumps between ON and OFF irregularly, and some chips finally jump to OFF, revoke the interference field, and can be restored by re-powering);
(4) Abnormal data: The attachment is the register data collected by the test.

  • 0
    TI__Prodigy 360 points

    Hi Han,

    Thanks for reaching out and sharing the results. Based on the information and Status value provided, please check my feedback below.

    Regarding STATUS register reading, please ensure the SPI readback is correct. The provided STATUS values looks random between units and it should be influenced by the radiated noise. Recommend to readback the SPI when the radiated noise is removed.

    Regarding "Some chips are finally jump to OFF, revoke the interference field, and can be restored by re-powering", it is possibly because the IC detected the influence by the radiated noise, reported with some specific faults, and pull the output low with the set fault actions. When the noise is removed, the device is expected to power up correctly again after a re-power. It is recommended to readback what kind of fault when output pull low. To read back the correct fault bit, please follow: when output pull low, remove the noise, and then read back the STATUS registers before re-power.    

    Besides, we have a next generation of programmable isolated gate driver, named UCC5881 which includes similar UCC587x features and provide more features. The full datasheet and additional documentation can be requested from the product page https://www.ti.com/product/UCC5880-Q1 :

    Alternatively, here is a direct link to request the full datasheet under NDA: https://www.ti.com/licreg/docs/swlicexportcontrol.tsp?form_id=338067&prod_no=UCC588X-Q1-DESIGN&ref_url=app_hvp_hvp_hpd_UCC5880-Q1 

    We also have additional link for CDD SW support under NDA: https://www.ti.com/licreg/docs/swlicexportcontrol.tsp?form_id=338067&prod_no=UCC588X-Q1-CDD-SW&ref_url=app_hvp_hvp_hpd_UCC5880-Q1

    Regards,

    Luowei