Tool/software:
Hello, about the door drive chip UCC5870QDWJQ1 products, we have encountered the following abnormal problems in the application.
The problem is described as follows:
(1) Occurrence scenario: EMC test - RS radiation immunity test (the product is grounded with a protective conductive shell, and the field strength of DUT is set to 150V/m);
(2) Product application: used in ON/OFF scenarios, the driver needs to be kept in the ON state during the test process;
(3) Abnormal description: In the RS test of 400M-1G, the driver chip has a driving abnormality in the 500M-800M frequency band (in the case of a given ON, the drive output jumps between ON and OFF irregularly, and some chips finally jump to OFF, revoke the interference field, and can be restored by re-powering);
(4) Abnormal data: The attachment is the register data collected by the test.