Tool/software:
Hi
we are basing our platform product on this IC. We currently face customers that have very specific questions about the current measurement of the finalized product that will obviously be very dependent on the BQ chips performance (the specific infos requested i could not find in both the Datasheet and the reference manual so please provide an insight if at all possible; in case the performance is dependant on parametrization values please give a tabluar overview so that this question has the potential to be helpful to other people as well; any pointers on the existing documentation is acceptable too)
The questions we are facing are:
- synchronousity of the current and voltage measurement (how much delay between the two) -- as per the technical reference manual the voltage measurement is done in one schedule and the current measurement in another independent schedule whether these start simulataneously or staggered is not to be found in the documentation so the durations given in the reference manual are of no use for answering the customer question. since there also is no way to have an interrupt on the availability of a new current value (talking of the fast current measurement not the one filtered such that it updates every 250ms) any application that takes the current value when the adscan or fullscan interrupts trigger would have to assume that the current has already updated at that time but that is not a secured assumtion and does not help with the customer question either.
- sensitivity error or the current measurement
