Other Parts Discussed in Thread: INA237, BQ76972, , BQ76940, BQ76942
Tool/software:
1. Clarification on CC Gain Formula
We are using a shunt resistor value of 0.25 mΩ and need clarification on the appropriate CC Gain value to be programmed in the calibration register for current scaling.
Datasheet vs Application Note Variance:
We have come across two different formulas for calculating CC Gain depending on use case:
- For Internal Coulomb Counting (AFE PassQ):
CC Gain = 7.4768 / Rsense(mΩ)
Example (0.25 mΩ):
CC Gain = 7.4768 / 0.25 = 29.9072 (rounded as needed)
- For External Integration (MCU-based):
CC Gain = 20,000 / (Rsense(Ω) × 32767)
Example (0.00025 Ω):
CC Gain = 20,000 / (0.00025 × 32767) ≈ 2442.7 μV/LSB
Question:
- Can you confirm that these two formulas are both valid but intended for different integration strategies (internal vs external)?
Should we use the 7.4768-based formula only if relying on PassQ / internal integration, and the 2443 μV/LSB value only if reading current externally via CC2?
2. Clarification on Coulomb Counting Comparison: Internal vs External
We are evaluating whether to use the internal charge integration feature (PassQ) or perform external coulomb counting in the MCU using CC2 data.
Summary of Current Understanding:
Feature / Aspect |
External (CC2) |
Internal (PassQ via CC1) |
Sampling Source |
CC2 (real-time, fast update) |
CC1 (filtered, slow update) |
Update Rate |
Every 3 ms (1.5 ms in FASTADC) |
Every 250 ms |
Resolution |
24-bit internally (16-bit reported) |
16-bit |
Integration Location |
MCU |
AFE firmware |
Reset Method |
Handled by MCU |
RESET_PASSQ() command (0x0082) |
Power Consumption |
Higher (FASTADC) |
Lower |
Accuracy for Pulsed Loads |
High |
Limited due to filter smoothing |
Ease of Implementation |
Complex (MCU-side integration) |
Simple (built-in charge accumulator) |
Questions:
- Is our comparison accurate in terms of performance and use-case suitability?
- Are there other hidden advantages or limitations in PassQ that we should be aware of?
For a system requiring high-speed SoC tracking (fast load changes), is external integration definitively recommended?