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TPS7H2140-SEP: Inquiry Regarding Short-Circuit Endurance of TPS7H2140

onuki
Prodigy 20 points
Part Number: TPS7H2140-SEP
Other Parts Discussed in Thread: TPS1H100-Q1

Tool/software:

Dear TI Support Team,

We are currently evaluating the TPS7H2140-SEP device for use in a high-reliability application where output short-circuit protection and repetitive fault endurance are critical.
We have reviewed the datasheet and application notes, but would like to confirm the following points:

1. **Short-Circuit Endurance**:
Does the TPS7H2140-SP device undergo any internal or external qualification testing (e.g., based on AEC-Q100-012 or similar) for repetitive short-circuit conditions?
- If so, how many ON/OFF thermal protection cycles (via thermal swing or thermal shutdown) can the device withstand without degradation?

2. **Comparison with Other TI Devices**:
We have seen documentation (e.g., SLVA709A) for other TI devices like TPS1H100-Q1 that have passed AEC-Q100-012 with 1 million+ short-circuit cycles.
- Can we consider similar robustness for the TPS7H2140, even though it is not a Smart Power Switch?

3. **Failure Criteria**:
In case of prolonged operation under repetitive short-circuit conditions (e.g., output shorted with ~57.6W power loss), is there an expected degradation mode or time-to-failure characterization?

If you could provide relevant test data, design margin considerations, or guidance on usage limits for high-repetition short-circuit conditions, it would be greatly appreciated.

Best regards,

  • 0
    TI__Intellectual 1265 points

    Hi Onuki,

    The TPS7H2140-SEP is meant and rated for space applications and not automotive. This means that the -SP and -SEP parts will have radiation data, testing, and specs they will adhere to and will be priced as such. Therefore, the TPS7H2140-SEP and -SP devices are qualified according to MIL-STD-883 rather than an automotive qualification/standard.

    Thanks,

    Elizabeth

  • 0 in reply to Elizabeth Won
    Prodigy 20 points

    Thank you for your response.

    As a follow-up:
    We understand TPS7H2140-SEP is qualified per MIL-STD-883 and not AEC-Q100.
    However, for design reliability assessment, could you please help us clarify the following:

    - Does TI have any internal test data (even if not public) regarding how many Thermal Swing or Thermal Shutdown cycles the TPS7H2140-SEP can safely withstand during output short-circuit conditions?

    - Is it acceptable to design assuming tens of thousands or more repetitive thermal swing events without functional degradation?

    Even rough guidance or TI’s design assumptions would be greatly appreciated to support our mission-critical reliability assessment.

    Thanks again!

  • 0 in reply to onuki
    TI__Genius 12020 points

    Hello,

    Elizabeth is out of office today, so I will fill in.

    Based on the Production Flow and Reliability Report for this device, this part goes through temperature cycling tests (500 cycles from -65C to 150C) defined by JESD22-A104. My understanding is that these are pass/fail tests and this would not hit the internal thermal shutdown threshold. However, this test and the  others listed in the report are intended to show the general durability of the part - which may be useful for your assessment.

    We do not explicitly collect data on degradation caused by repeated shorts or over-temp shutdowns. If operated within the Recommended Operating Conditions, I can say that we would not expect damage or degradation that would shorten the expected lifetime of the part. However, if operated outside of the Recommended Operating Conditions, the odds of accelerated degradation and/or damage become dependent on the conditions and frequency of the shorts.

    Because these are protection features meant to mitigate the risk of sudden/catastrophic damage, it is possible that more-frequent activation of these features would correlate with faster degradation. Ultimately, we do not have data to be able to say exactly what you should expect, but best practice would be to avoid these conditions when possible.

    Thanks,

    Sarah