Tool/software:
Thank you for your continued support.
Thank you for teaching me how to use a low inductance probe.
I have a question.
Once again, a failure occurred with the replaced U117 part (LMZ10504TZX-ADJ/NOPB). I confirmed that this failure was the same as when I first contacted you about this case (+3.3V was not output from the VOUT pin, and the VOUT pin was shorted to the GND pin). This time, the failure occurred without an overvoltage being applied to the VIN pin of U117.
I am attaching the state when this failure occurred.
Cause of LMZ10504 failure_20250619.pdf
Please refer to the attached file (Cause of LMZ10504 failure).
・SHT.1/3: This is the system of the device in which U117 failed. Various values related to U117 at the time of failure are shown in the upper left.
・SHT.2/3: The waveform state of the VIN pin of U117 at the time of failure is shown in Ch2.
・SHT.3/3: The photo and resistance value of the U117 part at the time of failure. (The package was accidentally destroyed when removing U117.)
As shown in SHT.3/3, when the components that seem to be capacitors on both sides were checked for continuity with a tester, a low value of about 2.3 to 2.4 Ω was confirmed.
Based on the above, what do you think is the cause of the failure? (In this case, no overvoltage was applied to the VIN pin at the time of the failure.)
When I first contacted you about this case, I had the failed U117 part analyzed by a third-party failure analysis organization, and it was found that the part that seems to be a capacitor (VOUT pin side) in U117 (LMZ10504TZX-ADJ/NOPB) had a short circuit failure.
I would appreciate your advice.