Tool/software:
We use the BQ76952PFBT and BQ25750RRVR devices and have measured an undershoot on the I2C SCL and SDA lines at the devices of around 700 mV which lasts for around 23 ns on the falling edges.
Would this transient create a problem further down in the lifecycle of these devices, beings the datasheet mentions 300 mV Abs Max. for undershoot?