Tool/software:
Dear all,
We are currently performing a characterization of the LDO function of the UCC27611 and we have the following questionings:
Best regards,
Tool/software:
Dear all,
We are currently performing a characterization of the LDO function of the UCC27611 and we have the following questionings:
Hello Lionel,
Hi Annabelle,
Thanks for your reply.
Could you share with us the life test conditions of the device?
Was it performed at maximum rated VDD voltage?
Best regards,
Lionel
Hi Lionel,
You can find lifetime tests for a device on TI.com by going to Quality & Reliability > Qualification Summary and then inputting the desired OPN. (link here: https://www.ti.com/qualificationsummary/qualsumm/home?actionId=2800)
I am getting in contact with our Product Engineers to determine what VDD is used for the tests, and will get back to you when that information is available.
Thanks,
Annabelle
Hi Lionel,
Yes, the life test was performed at the maximum recommended VDD for this device, which is 18V.
Thanks,
Annabelle
Hello Annabelle,
Thanks for the quick reply.
Can we assume that the life test was performed without any load on the LDO?
I understood from from your fisrt reply that the VREF is not designed to drive any external components.
However, a load regulation is specified in the datasheet for the VREF. Which is a little bit confusing for us.
Can you clarify how this assessment of the load regulation is performed?
Thanks,
Lionel
Hi Lionel,
For the LDO load, let me discuss this with my team. I will get back to you soon.
VREF load regulation is the measure of the variation in VREF as a function of load current and is specified either as a percentage or in parts-per-million per milliamp (ppm/mA). It is calculated by dividing the relative change in VREF at minimum and maximum load currents by the range of the load current. You can find more information in this white paper https://www.ti.com/lit/wp/slpy003a/slpy003a.pdf?ts=1756479675474&ref_url=https%253A%252F%252Fwww.google.com%252F
Annabelle
Hi Lionel,
Thank you for your patience. I am still working on getting the answer about the LDO load for you. I will let you know as soon as possible.
Thanks,
Annabelle
Hello Annabelle,
Thank you for the update.
Are you authorized by the meantime to share the bias configuration of the life test?
Thanks,
Lionel
Hello Annabelle,
Thank you for the update.
Are you authorized by the meantime to share the bias configuration of the life test?
Thanks,
Lionel
Hi Lionel,
I am still working on getting the exact conditions for you, but according to JEDEC standard JESD22-A108 (HTOL life test), the device should be tested at the maximum recommended operating temperature (in this case 140C), the max recommended VDD (in this case 18V), and the output stage is actively driving a load to replicate real-life conditions. This is why I believe there would be a resistive load on the internal LDO so that it is continually sourcing/sinking current.
You can sign up for a JEDEC account and find a PDF explaining the general set up for HTOL. Unfortunately, I cannot post it here.
Once I confirm this information with our Product Engineers, I will get back to you. Thank you for you patience!
Thanks,
Annabelle
Hi Lionel,
I have not been able to get the specific bias configuration or LDO load setup for HTOL test for UCC27611. This is an older part that RTM'd in 2012, and there were no details on the load/bias setup of the qualification tests, only the passing results. I appreciate your patience while I investigated this matter, and apologize that I cannot find more details for you.
Thanks,
Annabelle