Tool/software:
Hello, our client wants to conduct phase short-circuit tests on the power chip. There are two types: short-circuiting the phase before power-on and short-circuiting the phase after power-on. Both require that the VRD power supply not be damaged and can return to normal after the fault is removed. Is this requirement reasonable for the power chip? From the functional block diagram and principle, is there a possibility of the H-fet burning out? Are there any other chip solutions?
