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REF3330: Inquiries regarding the issue that Vout does not come out when starting REF3330

Grady Lee
Genius 4165 points
Part Number: REF3330

Tool/software:

Hi, TI expert

I would like to inquire about an unusual defect in REF3330AIRESER being used by the customer.

Previously, I was using it well without any problems, but a defect occurred without VOUT of REF3330AIRERSER (Hi-Z).

(The defect phenomenon is 1ea occurrence, and the rest of the parts are operating normally.)

When I checked the defective parts, they are reproduced according to the VIN's Rise time and are as follows.

[Defect phenomenon waveform]

CH2: VIN, CH3:VOUT
VIN = 3V, Rise time : 116msec -> VOUT No Output, HI-Z

[Good waveform]

VIN = 3V, Rise time : 15msec  -> VOUT (Good work)

Q1) Will there be any impact due to the raise time of the Vin of REF3330? Are there any restrictions or requirements based on the raise time?

Q2) Are there any other expected causes?

3) Should we report the above phenomenon as REF3330 defect and proceed with defect analysis? (The defect phenomenon is 1ea occurrence, and the rest of the parts are operating normally)

Please check. Thank you.

  • 0
    TI__Expert 8650 points

    Hello,

    This is a duplicate query. We are currently addressing this question in this forum:

     RE: REF3330: Vin Rise time 

    Please refer to the above link for further details. We are actively looking into this question.

    Thanks,

    Jackson 

  • 0 in reply to Jackson Wightman
    Genius 4165 points

    Hi, Jackson

    It is the same as the question asked by the customer of the Link.

    However, as in the last question on the link, Vout does not come out normally even if you test with Vin=3.3V.
    Currently, the part of the phenomenon where the Vout is not coming out properly is 1ea, and is there a possibility that the part(REF3330) will be defective?

    In addition, Cbypass (1uF~10uF) on Vin side is recommended on Datasheet, but I checked with the customer and they applied Cbypass (0.1uF). Will this be a problem, too?

    Thanks.

  • 0 in reply to Grady Lee
    TI__Intellectual 1130 points

    Hi,

    We'll continue in this thread.

    Please have the customer test again with the recommended bypass capacitance to see if the behavior is any different. We will also take a look at the device ourselves to see if we observe any abnormal behavior.

    -Henry

  • 0 in reply to Henry Naguski
    Genius 4165 points

    Hi, Henry

    The customer changed it to Cbypass (1uF~10uF) and tested it, but there is no change, and Vout still doesn't come out.

    As I asked you in the beginning, there was no problem since it was in use from the past, and the defect phenomenon is being reproduced only for 1ea parts this time, is it correct to proceed with the defect analysis after seeing it as a defect in the IC?

    Thanks.

  • 0 in reply to Grady Lee
    TI__Intellectual 1130 points

    I was not able to observe any abnormal behavior of the device with slow VIN rise times. At this point, it is up to the customer to decide how they would like to continue.

    -Henry