LM5066I: short to GNS test failure

Part Number: LM5066I

Tool/software:

Hi Sir,

The LM5066I board that previously reviewed has now been manufactured. After performing the short circuit test, the LM5066I is showing abnormal behavior, with the GATE not functioning properly (VGATE = VOUT).
Could please help review this issue and advise on possible causes or recommended debug methods?
Attached is the LM5066I schematic. I have already assembled the third MOSFET.
I captured the waveform during the short circuit as follows:
Blue CH: VIN_BUSBAR, Yellow CH: GATE, Purple CH: VIN, Green CH: short-circuit current.

BDB-PWR0039AB01 _ 02_Hot Swap D-1.pdf

  • Thanks for reaching out. Customer had already reached out to us through email. We are working with the customer directly and respond to them.

  • After the short-circuit test, the LM5066I GATE pin lost its boost capability (VGATE = VIN), confirming that the LM5066I has been damaged.
    I have already repaired/replaced the LM5066I multiple times, but I am still unable to identify the root cause of the failure.
    Under normal conditions, the LM5066I should maintain VGATE – VOUT = 11V ~ 15V.

    Could you please help check and provide analysis on the possible cause of the LM5066I damage? Assistance from your FAE team would be greatly appreciated.

  • I think you already reach out to me through email. Please wait till Monday to respond. Kindly don't duplicate the same query in E2E and email.