Tool/software:
Hi,
I'm considering using the TPS16851 to protect a semiconductor test socket. However, powering the TPS16851 from the same VDD that powers the DUT is causing issues with our leakage (DUT off measurement) measurements. Is it possible to power the TPS16851 from a separate VDD?
Also, for the current sharing The RILIM for each individual eFuse must be selected based on Equation 12. RILIM = (1.1 × N × RIMON)/3 Where N = number of devices in parallel chain.
If I use this formula for 2 devices, as on the TPS1685EVM, it yields 1613Ω, which is double what is used on the TPS1685EVM. (1.1 * 2 * 2200)/3 = 1613. If I use n = 1, it works out to 806Ω. which is what is used on the TPS1685EVM. Is this formula correct?