Tool/software:
Hi TI Team,
I’m seeing intermittent failures of input ceramic capacitors in my BQ25720RSNR charger design after extended field operation. Units pass all initial tests and run reliably during validation, but after some weeks/months in the field, one or more of the six input 10µF, 50V X7R ceramic capacitors (C19–C24) will short.
Input: 24V DC
Output: Up to 8.4V, max 4A
Input capacitors: 6 × 10µF, 50V X7R MLCCs
Additional: 1Ω damping resistor, 0.47µF cap, TVS diode on input
No visible damage: No cracks, joints are good, caps >0.2" from PCB edges
Failures show up randomly after prolonged use; not all caps always fail, sometimes just some of them. Soldering/process is sound and there’s no visible physical/mechanical defect.
Could you suggest likely root causes or improvements, especially regarding input cap selection for this IC and application? Any reliability guidance for high DC bias/hot-plug/VAP scenarios would be appreciated.
Schematic snippet attached.
