• State
  • Locked Locked
  • Replies 1 reply
  • Subscribers 63 subscribers
  • Views 141 views
  • Users 0 members are here
Support feedback
Options
Options
Related

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

BQ25638: BQ25638 ESD issue

q h
Intellectual 350 points

Part Number: BQ25638

HI

As shown in the figure, we have a product that uses the BQ25638. During electrostatic discharge (ESD) testing between SYS and GND, the connection between SYS and BAT always disconnects momentarily and then reconnects. May I ask if there is a way to confirm the cause of this issue? Is there a method to improve the situation so that the MOS between SYS and GND does not disconnect during ESD testing?

image.png

  • 0
    TI__Mastermind 35950 points

    Hello, 

    Thank you for reaching out via E2E. 

    Is the BQ25638 IC being powered from either VBUS or BAT pin during the ESD testing? The internal BATFET between SYS and BAT pins will not remain on if charger IC is not powered. 

    Best Regards,

    Garrett