Part Number: TPS7A20
Hi,
I have an application that uses the TPS7A2030PDBVR and is experiencing issues during ESD testing. The symptom occurs after a direct-contact ±4 kV ESD event: the LDO output drops to 0 V while the EN pin remains held high. After a power cycle (driving the EN pin low and then high again), the device recovers and operates normally.
We tested the same setup using a pin-to-pin compatible LDO, TLV70230DBVR, and it does not exhibit this ESD issue. However, we would prefer to use the TPS7A2030PDBVR due to its significantly lower quiescent current (Iq).
In our circuit design, we have the following capacitors:
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At the LDO input (VBAT = 3.3 V to 4.2 V): 10 µF and 0.1 µF placed close to the LDO
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At the LDO output (3.0 V): 1 µF and 0.1 µF placed close to the LDO
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Additional bulk capacitance located further away: approximately 100 µF on the LDO input line and 20 µF on the LDO output line
Please advise if there is any explanation and recommendation regarding this issue.
