Part Number: LMG342X-BB-EVM
Hi all,
I have been desigining a bidirectional test system based off of the listed motherboard and its associated LMG3422 daughter card, and am starting to push into higher frequency, higher voltage switching. I'm using the device in a very unorthodox manner, in that I am not designing the ILpp to any metric that makes sense, but rather using the resonating current in the inductor as a test platform with current sensing devices in line on either side of the inductor.
I'll list test conditions below, and I'm sure there will be some questions that need to be answered on changes to help dial this in, but effectively here is the crux of the issue:

The green waveform here is the DUT output I am testing (which has a lot of package parasitics, so disregard this one for now), but the blue waveform is my reference current captured via a Hioki 3274. I would expect the waveform to be relatively triangular, but as you can see, I am getting a small dip in each direction as the FETs close/open
Test Conditions:
Vin: 100V, D: 0.5, VO: 50V, I_LOAD: 0A, ILpp: ~10A, L: 1.25uH, fsw: 1MHz, Cout: ~600uF via a 560uF bulk electrolytic, and several ceramics to optimize ESR, Cin: ~60uF via 2x HV film cap and ceramics
My current running theory is input impedance is the cuprit. I am interfacing the input via 1m long cables, which I am assuming would add a non-trivial amount of input impedance and possibly affect the waveshape, but I wanted to see if the team has run into this form of distortion and how it might be cleaned up, as the goal here is try and use the device as a form of "noisy trianglular waveform generator" to examine current sensing full scale ranges in a noisy environment.





