The FIR/EFR data of TPS22912CYZVR

Tsuguhiko Asai

Expert 1260 points

Please teach us the simulation data of TPS22912CYZVR.

・FIT (Failure In Time)

・EFR (Early failure rate)

The simulation condition as follows

Ambient Temperature : 55degreeC and 75degreeC

Period of using this IC: 5 years and 10 years (at 8760h/year)

Vcc: 3.3V and 3.6V

over 12 years ago

0 Tsuguhiko Asai over 12 years ago

Expert 1260 points

Let me ask you a question by addition.

The FIT Data which is provided by TI have much number of the samples of the examination, usually.

Will the reason be because TI added up the reliability test result of the IC of the same series?

FAR data sample is following.

http://focus.ti.com/quality/docs/singlesearchresults.tsp?templateId=5909&navigationId=11213&mtbfType=true&searchType=orderableOption&partialSearch=false&orderablePartNumber=TPS22912CYZVR

0 Aramis P. Alvarez over 8 years ago in reply to Tsuguhiko Asai

TI__Genius 10370 points

Hi,

I apologize that no one has followed up with your question. I'm going to close this thread, but if you still have a question please feel free to post a brand new thread instead of replying to this one. We will do our very best to respond within 24 hours to any new post you might have :-)

Best Regards,
Aramis P. Alvarez

Power management

Power management forum

The FIR/EFR data of TPS22912CYZVR