Currently having a BQ24123 design run through IEC 61010 safety testing. Test lab is suggesting shorting Pin 3 (input) to Pin 10 (output) as a valid failure to test. This would simulate the internal FET failing SHORTED. First off, does this happen, verses failing OPEN?
Secondly, assuming the FET can fail shorted, would the BQ24123 over-current trip?
Third, if the over-current did trip, would it be able to SHUT DOWN, if the FET was failed shorted? I think not.
Is there some other additional protection that might be commonly added to protect against this kind of eventuality (such as a PTC in series with the battery)?
If there was no way to shut down the current in this failure mode, the battery pack contains internal protection, which should trip, provided the charging current exceeded it's maximum rating.
Thanks,
Robb.