Hello-
We have been seeing failures which we believe to be caused by the TI cell monitoring BQ76PL536PAPR. When our products are on the shelf we are having a communication fault. We read on TI’s website that the BQ76PL536APAPR (rev.A) has improved communication, and was wondering if the older rev had a known communication issue? Specifically:
BQ76PL536PAPR
- What were the faults with the initial rev of the chip?
- Is there a way to identify chips with faults?
- Is there a way to induce the failure in the part (for internal testing) ?
- Would it be possible to send back what we believe to be failed components for analysis?
BQ76PL536APAPR
- What improved in the new re of the part?
- List of potential changes with the new component?
- Can we get a copy of any information that is available (data sheets, quality documentation)
Thanks and Best Regards
-Tim Starr on behalf of JD@NE