Hi all,
Test LM5085 power on/off recycle in chamber setting -40° C, IC damage.
Test method
once power on, IC damage(NCC C81, C84)
Test method
power on/off recycle , IC OK(Add NCC C88, C91, C92 with C81, C84)
Test method
once power on, IC damage(Add C88, C91, C92 with NCC C81, C84)
Why ? I know E-Cap at low temperature capacitance decrease, but review 2 different E-Cap temperature rang are - 40° C ~105° C......
