Dear All,
I have the a issue to use the PL455 the sample the cell volt.
The issue is: some time ,the cell voltage is not correct, it changes very big.
the difference between the sample value and real value is very large.( 100mV -- 300mV).
The registers setting list as flow:
Device Version 0x00 (0) Digital die version number):8.
Device Version 0x01 (1) Analog die version number):6.
CHANNELS 0x03-06 (3-6) Channel Select:ff.ff.3f.0
OVERSMPL 0x07 (7) Command Oversampling:7b.
ADDR 0x0A (10) Device Address:0.
GROUP_ID 0x0B (11) Group ID:0.
DEV_CTRL 0x0C (12) Device Control:0.
NCHAN 0x0D (13) Number of Channels:10.
DEVCONFIG 0x0E (14) Device Configuration:10.
PWRCONFIG (0x0F) (15) Power Configuration:80.
COMCONFIG 0x10-11 (16-17) Communications Configuration:10-c0.
TXHOLDOFF 0x12 (18) UART Transmitter Holdoff:0.
CBCONFIG 0x13 (19) Balance Configuration:0.
CBENBL 0x14–15 (20-21) Balancing Enable:0-0.
TTSTCONFIG 0x1E-1F (30-31) Test Configuration:0-0.
TESTCTRL 0x20-21 (32-33) Test Control:0-0.
TEST_ADC 0x22-24 (34-36) ADC Output Test:0-0-0-0.
CTO 0x28 (40) Communication Timeout:76.
CTO_CNT 0x29-2B (41-43) Communication Timeout Counter::0-0-1-0.
AM_PER 0x32 (50) Auto-Monitor Period:0.
AM_CHAN 0x33-36 (51-54) Auto-Monitor Channel Select:0-0-0-0
AM_OSMPL 0x37 (55) Auto-Monitor Oversampling:0.
SMPL_SLY1 0x3D (61) Initial Sampling Delay:0.
Cell_CSPER 0x3E (62) Cell Voltage and Internal Temperature Sampling Interval:bc.
AUX_SPER 0x3F-42 (63-66) AUX Sampling Period:44.44.44.44
TEST_SPER 0x43-44 (67-68) Test Sampling Periods:f9.99
SHDN_STS 0x50 (80) Shutdown Recovery Status:80.
STATUS 0x51 (81) Device Status:0.
FAULT_SUM 0x52-53 (82-83) Fault Summary:0.0
FAULT_COM 0x5E-5F (94-95) Communications Fault:0.0
FAULT_SYS 0x60 (96) System Fault:0.
FAULT_DEV 0x61-62 (97-98) Chip Fault:0.0
FAULT_GPI 0x63 (99) GPI Fault:0.
FO_CTRL 0x6E-6F (110-111) Fault Output Control:0.0
LOT_NUM 0xBE-C5 (190-197) Device Lot Number: f.52.56.15.17.43.53.f
SER_NUM 0xC6-C7 (198-199) Device Serial Number:6.b2
TSTR_ECC 0xE6-ED (230-237) ECC Test Result[1:0]: 0.0.0.0.0.0.0.0
CSUM 0xF0-F3 (240-243) Checksum: 64.2e.13.37
CSUM_RSLT 0xF4-F7(244-247) Checksum Readout : 64.2e.13.37
TEST_CSUM 0xF8-F9 (248-249) Checksum Test Result: 0.0.2.0
EE_BURN 0xFA (250) EEPROM Burn Count:2.
The caps on OUT value 100nF; and the scope is
Could you give me same suggest.
Thanks!
