I'm having issues with the BQ24296M IC in my devices; they consistent develop a short internally (verified by decap) at the SW pins to PGND.
To help troubleshoot this issue I would like to monitor the signals into and out of the IC (both of the isolated chip as well as in-situ if possible) and generate plots like those in Figures 40-48 of the spec sheet (SLUSBU3A rev 2015).
I was wondering if you could help me obtain the right tools for this measurement. Does TI have any breakout boards or a probe kit that I could buy for this?
Thank you for your assistance,