• State
  • Locked Locked
  • Replies 3 replies
  • Subscribers 62 subscribers
  • Views 817 views
  • Users 0 members are here
Support feedback
Options
Options
Similar topics

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

TPS2022 device damage if current draw above 1A?

Pang
Expert 2395 points
Other Parts Discussed in Thread: TPS2022

Customer is using TPS2022. I would like to check since this part is having internal over current protection circuit but why part still will damage if current is draw more than 1A?

This is showed at page 2 on the block diagram and page 3 description of the datasheet.

"Current Sense

A sense FET monitors the current supplied to the load. The sense FET measures current more efficiently than
conventional resistance methods. When an overload or short circuit is encountered, the current-sense circuitry
sends a control signal to the driver. The driver, in turn, reduces the gate voltage and drives the power FET into
its saturation region, which switches the output into a constant-current mode and holds the current constant while
varying the voltage on the load."

  • 0
    TI__Mastermind 42795 points

    Just make sure you keep all pins within their ABS max ratings and also operate long term within the recommended ratings. What usually damages the device is EOS due to excessive voltages applied to the pins and not over current. Put a scope on the IN and OUT terminals while the stresses are applied to make sure.

  • 0 in reply to Eric Wright
    Expert 2395 points
    Thanks Eric,

    Can you provide more technical data that the EOS damages is due to excessive voltages applied to the pins and not over current. Any evidence show?
    We are using a power conditioner or current stabilizer in the electrical tester to suppress such EOS problem. How can the EOS happen unless the current is > 1A
  • 0 in reply to Pang
    TI__Mastermind 42795 points

    In order to provide more information, TI would have to perform a detailed failure analysis on the device. But from my experience, a failure event almost always starts with over-voltage and then if an internal circuit gets damaged then the secondary result will be high current.