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LM2596: LM2596

Part Number: LM2596

I am trying to figure out what caused a failure of 2 of my LM2596-5V parts where they developed low impedance between pin1 and pin 2 of ~49 ohms. They failed in two separate identical setups. Thank you

  • Please attach your schematic and layout and your input, output and load specs.

    Thanks

  • Hello,

    Here is my schematic and layout. The load is 1A combined to 3 ARM processors where one takes 0.5A and the other two 0.25A each.

    Thank you

    Marina

  • Your schematic and layout look good.

    Based on this view, I assume those vias are going to a good solid ground plane.

    You might want more ground plane on top for heat dissipation; I can not see the entire area.

    I would take the FB input directly from C203 rather than the inductor.  You can extend the

    small trace you have now to tap into the (+) of C203.

    However, these issues may or may not influence the problem you are seeing.

    Does the damage occur at power up or after a while ??

    Can you monitor the input voltage and switch node during a damage event??

    Is there a possibility that the input voltage is spiking above the abs max of the device??

    Or that some load is pulling Vout below ground??

    These things could possibly damage the device.

  • Hello,

    Thank you for reviewing my issue. The failure occurred well into testing - during the overnight final burn-in after a full day of setup and testing. It is not easily reproduced. The chance to get the event on the scope is small.

    My power supply is well regulated and there are 4 more of these attached to the same Vin, one is 5V and 3 are adjustable +15V,-15V and +12V.

    It is interesting that it has ~50R from pin2 to pin1 resulting in a DC voltage at the level of input signal presenting itself at the output (pin2 and of course far output and FB pin4. There are no oscillations. I was hoping to get a hint from that piece of information.

    I keep staring at this block diagram from ON Semi.
  • Can you send a scope shot of both the input voltage and switch voltage during a normal burn-in test; or normal operation.

    There may be a clue from the wave forms.

  • Ch1 input, Ch2 switching output

  • This looks OK.

    I would return the damaged devices to TI and we will try to do some FA on them.

  • Hello Frank, 

    Thank you so much for your insight and your time. I will return part to TI for FAI.

    I enjoyed the session!

    Regards,

    Marina 

  • Hello, What would be the prefered way to arrange sending parts back for FA?
    Thank you
    Marina
  • I will forward this to our FA manager for this device.

  • I will wait then. Thank you
    Regards, Marina
  • Please fill out the attached form and send parts to the following address:

    Texas Instruments                                                                                                           

    2900 Semiconductor Dr.

    Bldg. E

    Santa Clara, CA 95051, USA

    Attention: QEM Administrator

    Tel: 669-721-5316

    fa_request.doc

  • I will gather information and send parts. Thank you

    Regards,

    Marina