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BQ40Z60: Controlling Temperature with failures

Part Number: BQ40Z60
Other Parts Discussed in Thread: BQSTUDIO, BQ40Z50-R2

I am using the BQ40Z60 battery controller in an intrinsically safe application (IEC60079-11). The design must not under any chip failure mode result in reaching thermal ignition temperatures either of the chip or any associated component. I need to eliminate the amount of power that could be supplied to the chip through the VCC and BAT pins. would 1500 Ohms instead of 10 Ohms cause any issues. the pack is 4 cells. the HIDRV and LODRV FET gates and the PH pins will require protection. is there a problem with series resistance in these lines if i shunt the resistance with capacitors to preserve waveform rise and fall times. I plan to use 50 mA  fuses in series with the cell voltage sense lines and balancing resistors.

Please give me your thoughts.

Jerry West 

  • Hi ,
    One of our BMS experts has been assigned to your issue and will answer shortly.

    Regards,
    David
  • Your ideas sound reasonable, although 1.5kohms might be excessive on VCC since the IC occasionally requires current spikes for its internal charge pump when flash updates occur. You can try it and monitor the voltages at those pins while programming a .srec file using bqStudio to see how far they drop. If you increase the capacitance on those pins you might be okay with periodic flash updates in the field. 1.5k on BAT might also affect the voltage measurements, so you should test that.
    You might also get away with the other switching pins if you can maintain the waveforms.

    Before you get too far along with your design using bq40z60 we would like to make sure you have considered all of the options as well as the challenges of working with a such a tightly integrated solution. Since you are trying to make this intrinsically safe, it seems like it would be much simpler to use a separate gauge (bq40z50-R2) and separate charger. Then you could address the intrinsic safety of each IC separately and worry less about the impact of those mitigations on the tightly coupled interaction of such an integrated solution.
     
    We have also found that many customers using bq40z60 have difficulty designing their board to pass EMI testing.  This is due to the limited degree of freedom you have when laying out such an integrated solution which includes a switch-mode device.  As attractive as it may sound to have the charging, gauging, and protection functions in one IC, in practice by using a separate charger and a separate gauge you get more flexibility and it can actually be easier to design.  Not only can you choose from a wider range of chargers and gauges, but you can take advantage of newer technology and newer firmware.  Popular choices for discrete multi-cell chargers range from standalone ones with integrated FETs like bq2417x or external FETs (for higher currents) like bq2461x to SMBus/I2C controlled chargers like bq2477x, among many others.  The newest and most interesting charger is the buck/boost charger bq2570x which allows you to take any voltage input and charge any battery voltage stack, as well as take that battery voltage and boost or buck it back out to any target voltage.  It’s great for USB Type-C and USB-PD applications.  On the gauge side, the most popular new standalone gauge is bq40z50-R2 which has the most recent feature set and more extensive safety and protection options.
     
    Of course TI is here to support you no matter which ICs you choose, but be sure to consider all of your options and don’t assume that integration is always the best.
  • Thanks,

    Jerry